https://3demmethods.i2pc.es/index.php?action=history&feed=atom&title=1984Cohen_Validity 2026-05-24T19:51:56Z Revision history for this page on the wiki MediaWiki 1.44.2 https://3demmethods.i2pc.es/index.php?title=1984Cohen_Validity&diff=1916&oldid=prev 2009-08-01T00:46:13Z

<p></p> <p><b>New page</b></p><div>== Citation ==<br /> <br /> Cohen, H. A.; Schmid, M. F. &amp; Chiu, W. Estimates of validity of projection approximation for three-dimensional reconstructions at high resolution. Ultramicroscopy, 1984, 14, 219-26<br /> <br /> [http://scholar.google.es/scholar?cites=17061152060248932550 Cited by]<br /> <br /> == Abstract ==<br /> <br /> As spatial frequency increases, the electron microscope &quot;image&quot; deviates increasingly from a true projection of the specimen&#039;s structure. This is due to the finite radius of the Ewald sphere. Quantitative estimates of these deviations of the reconstruction from the true projection are presented for a range of accelerating voltages, spatial frequencies, specimen thicknesses, and specimen tilts.<br /> <br /> == Keywords ==<br /> <br /> CTF, high frequency<br /> <br /> == Links ==<br /> <br /> Article: http://www.ncbi.nlm.nih.gov/pubmed/6506323<br /> <br /> == Related software ==<br /> <br /> == Related methods ==<br /> <br /> == Comments ==</div>

WikiSysop