<?xml version="1.0"?>
<feed xmlns="http://www.w3.org/2005/Atom" xml:lang="en">
	<id>https://3demmethods.i2pc.es/index.php?action=history&amp;feed=atom&amp;title=2003Velazquez_ARMA</id>
	<title>2003Velazquez ARMA - Revision history</title>
	<link rel="self" type="application/atom+xml" href="https://3demmethods.i2pc.es/index.php?action=history&amp;feed=atom&amp;title=2003Velazquez_ARMA"/>
	<link rel="alternate" type="text/html" href="https://3demmethods.i2pc.es/index.php?title=2003Velazquez_ARMA&amp;action=history"/>
	<updated>2026-05-24T20:37:26Z</updated>
	<subtitle>Revision history for this page on the wiki</subtitle>
	<generator>MediaWiki 1.44.2</generator>
	<entry>
		<id>https://3demmethods.i2pc.es/index.php?title=2003Velazquez_ARMA&amp;diff=1860&amp;oldid=prev</id>
		<title>WikiSysop at 08:15, 21 May 2009</title>
		<link rel="alternate" type="text/html" href="https://3demmethods.i2pc.es/index.php?title=2003Velazquez_ARMA&amp;diff=1860&amp;oldid=prev"/>
		<updated>2009-05-21T08:15:12Z</updated>

		<summary type="html">&lt;p&gt;&lt;/p&gt;
&lt;p&gt;&lt;b&gt;New page&lt;/b&gt;&lt;/p&gt;&lt;div&gt;== Citation ==&lt;br /&gt;
&lt;br /&gt;
J.A. Velázquez-Muriel, C.O.S.Sorzano, J.J. Fernández, J.M. Carazo. A method for estimating the CTF in electron microscopy based on ARMA models and parameter adjusting. Ultramicroscopy 96, 1:17-35. (2003)&lt;br /&gt;
&lt;br /&gt;
[http://scholar.google.com/scholar?hl=en&amp;amp;lr=&amp;amp;newwindow=1&amp;amp;cites=14827085864633020972 Cited by]&lt;br /&gt;
&lt;br /&gt;
== Abstract ==&lt;br /&gt;
&lt;br /&gt;
In this work, a powerful parametric spectral estimation technique, 2D-auto regressive moving average modeling&lt;br /&gt;
(ARMA), has been applied to contrast transfer function (CTF) detection in electron microscopy. Parametric techniques&lt;br /&gt;
such as auto regressive (AR) and ARMA models allow a more exact determination of the CTF than traditional&lt;br /&gt;
methods based only on the Fourier transform of the complete image or parts of it and performing some average&lt;br /&gt;
(periodogram averaging). Previous works revealed that AR models can be used to improve CTF estimation and the&lt;br /&gt;
detection of its zeros. ARMA models reduce the model order and the computing time, and more interestingly, achieve&lt;br /&gt;
increased accuracy. ARMA models are generated from electron microscopy (EM) images, and then a stepwise search&lt;br /&gt;
algorithm is used to fit all the parameters of a theoretical CTF model in the ARMA model previously calculated.&lt;br /&gt;
Furthermore, this adjustment is truly two-dimensional, allowing astigmatic images to be properly treated. Finally, an&lt;br /&gt;
individual CTF can be assigned to every point of the micrograph, by means of an interpolation at the functional level,&lt;br /&gt;
provided that a CTF has been estimated in each one of a set of local areas. The user need only know a few a priori&lt;br /&gt;
parameters of the experimental conditions of his micrographs, for turning this technique into an automatic and very&lt;br /&gt;
powerful tool for CTF determination, prior to CTF correction in 3D-EM.&lt;br /&gt;
The programs developed for the above tasks have been integrated into the X-Windows-based Microscopy Image&lt;br /&gt;
Processing Package (Xmipp) software package, and are fully accessible at www.biocomp.cnb.uam.es.&lt;br /&gt;
&lt;br /&gt;
== Keywords ==&lt;br /&gt;
&lt;br /&gt;
CTF estimation, parametric models&lt;br /&gt;
&lt;br /&gt;
== Links ==&lt;br /&gt;
&lt;br /&gt;
Article http://www.ncbi.nlm.nih.gov/pubmed/12623169&lt;br /&gt;
&lt;br /&gt;
== Related software ==&lt;br /&gt;
&lt;br /&gt;
http://xmipp.cnb.csic.es/twiki/bin/view/Xmipp/Assign_CTF&lt;br /&gt;
&lt;br /&gt;
== Related methods ==&lt;br /&gt;
&lt;br /&gt;
== Comments ==&lt;/div&gt;</summary>
		<author><name>WikiSysop</name></author>
	</entry>
</feed>