https://3demmethods.i2pc.es/index.php?action=history&feed=atom&title=2013Egerton_RadiationDamage 2026-05-24T20:20:48Z Revision history for this page on the wiki MediaWiki 1.44.2 https://3demmethods.i2pc.es/index.php?title=2013Egerton_RadiationDamage&diff=2306&oldid=prev 2013-04-01T09:33:41Z

<p>Created page with &quot;== Citation == Egerton, R. F. Control of radiation damage in the TEM. Ultramicroscopy, 2013, 127, 100-108 == Abstract == The problem of electron-beam damage in the transmis...&quot;</p> <p><b>New page</b></p><div>== Citation ==<br /> <br /> Egerton, R. F. Control of radiation damage in the TEM. Ultramicroscopy, 2013, 127, 100-108<br /> <br /> == Abstract ==<br /> <br /> The problem of electron-beam damage in the transmission electron microscope is reviewed, with an emphasis on radiolysis processes in soft materials and organic specimens. Factors that determine the dose-limited resolution are identified for three different operational modes: bright-field scattering-contrast, phase-contrast and dark-field microscopy. Methods of reducing radiation damage are discussed, including low-dose techniques, cooling or encapsulating the specimen, and the choice of imaging mode, incident-beam diameter and incident-electron energy. Further experiments are suggested as a means of obtaining a better understanding and control of electron-beam damage.<br /> <br /> == Keywords ==<br /> <br /> Radiation damage, resolution limit, low dose imaging, cryoEM<br /> <br /> == Links ==<br /> <br /> http://www.ncbi.nlm.nih.gov/pubmed/22910614<br /> <br /> == Related software ==<br /> <br /> == Related methods ==<br /> <br /> == Comments ==</div>

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