CoSS: Created page with "== Citation == C.O.S. Sorzano, J. Vargas, J.M. de la Rosa-Trevín, A. Zaldívar-Peraza, J. Otón, V. Abrishami, I. Foche, R. Marabini, G. Caffarena, J.M. Carazo. Outlier dete..."

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Created page with "== Citation == C.O.S. Sorzano, J. Vargas, J.M. de la Rosa-Trevín, A. Zaldívar-Peraza, J. Otón, V. Abrishami, I. Foche, R. Marabini, G. Caffarena, J.M. Carazo. Outlier dete..."

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== Citation ==

C.O.S. Sorzano, J. Vargas, J.M. de la Rosa-Trevín, A. Zaldívar-Peraza, J. Otón, V. Abrishami, I. Foche, R. Marabini, G. Caffarena, J.M. Carazo. Outlier detection for single particle analysis in Electron Microscopy. International Work-Conference on Bioinformatics and Biomedical Engineering, IWBBIO, 950 (2014)

== Abstract ==

Electron Microscopy (EM) of macromolecular structures us-
ing a single particle approach normally involves a two-dimensional (2D)
classification step as a exploratory data analysis in which conformational
changes, contaminants, or damaged particles may be identified. This step
is nowadays even more important as automatic acquisition procedures
are routinely employed and hundreds of thousands or millions of images
can be acquired at the electron microscope. Automatic particle picking
algorithms have a non-negligible false positive rate (wrongly selected par-
ticles), and many times they unadvertedly pass through the 2D classifi-
cation, thus contaminating the dat
aset employed for 3D reconstruction.
In this article we present an algorithm to reduce the number of these
contaminating images, generally referred to as outliers.

== Keywords ==

== Links ==

http://biocomp.cnb.csic.es/~coss/Articulos/Sorzano2014.pdf

== Related software ==

CL2D, Xmipp

== Related methods ==

== Comments ==

2014Sorzano Outlier - Revision history

CoSS: Created page with "== Citation == C.O.S. Sorzano, J. Vargas, J.M. de la Rosa-Trevín, A. Zaldívar-Peraza, J. Otón, V. Abrishami, I. Foche, R. Marabini, G. Caffarena, J.M. Carazo. Outlier dete..."