https://3demmethods.i2pc.es/index.php?action=history&feed=atom&title=2018Hettler_Charging 2026-05-24T21:10:55Z Revision history for this page on the wiki MediaWiki 1.44.2 https://3demmethods.i2pc.es/index.php?title=2018Hettler_Charging&diff=3166&oldid=prev 2017-12-28T06:45:03Z

<p>Created page with &quot;== Citation == Hettler, S.; Kano, E.; Dries, M.; Gerthsen, D.; Pfaffmann, L.; Bruns, M.; Beleggia, M. &amp; Malac, M. Charging of carbon thin films in scanning and phase-plate tr...&quot;</p> <p><b>New page</b></p><div>== Citation ==<br /> <br /> Hettler, S.; Kano, E.; Dries, M.; Gerthsen, D.; Pfaffmann, L.; Bruns, M.; Beleggia, M. &amp; Malac, M. Charging of carbon thin films in scanning and phase-plate transmission electron microscopy. Ultramicroscopy, 2018, 184, 252-266<br /> <br /> == Abstract ==<br /> <br /> A systematic study on charging of carbon thin films under intense electron-beam irradiation was performed in a transmission electron microscope to identify the underlying physics for the functionality of hole-free phase plates. Thin amorphous carbon films fabricated by different deposition techniques and single-layer graphene were studied. Clean thin films at moderate temperatures show small negative charging while thin films kept at an elevated temperature are stable and not prone to beam-generated charging. The charging is attributed to electron-stimulated desorption (ESD) of chemisorbed water molecules from the thin-film surfaces and an accompanying change of work function. The ESD interpretation is supported by experimental results obtained by electron-energy loss spectroscopy, hole-free phase plate imaging, secondary electron detection and x-ray photoelectron spectroscopy as well as simulations of the electrostatic potential distribution. The described ESD-based model explains previous experimental findings and is of general interest to any phase-related technique in a transmission electron microscope.<br /> <br /> == Keywords ==<br /> <br /> == Links ==<br /> <br /> http://www.sciencedirect.com/science/article/pii/S0304399117303169<br /> <br /> == Related software ==<br /> <br /> == Related methods ==<br /> <br /> == Comments ==</div>

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