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	<title>2021Bieber FIBET - Revision history</title>
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	<updated>2026-06-13T13:24:45Z</updated>
	<subtitle>Revision history for this page on the wiki</subtitle>
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	<entry>
		<id>https://3demmethods.i2pc.es/index.php?title=2021Bieber_FIBET&amp;diff=4137&amp;oldid=prev</id>
		<title>WikiSysop: Created page with &quot;== Citation ==  Bieber, A.; Capitanio, C.; Wilfling, F.; Plitzko, J. &amp;amp; Erdmann, P. S. Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cry...&quot;</title>
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		<updated>2021-11-25T13:25:47Z</updated>

		<summary type="html">&lt;p&gt;Created page with &amp;quot;== Citation ==  Bieber, A.; Capitanio, C.; Wilfling, F.; Plitzko, J. &amp;amp; Erdmann, P. S. Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cry...&amp;quot;&lt;/p&gt;
&lt;p&gt;&lt;b&gt;New page&lt;/b&gt;&lt;/p&gt;&lt;div&gt;== Citation ==&lt;br /&gt;
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Bieber, A.; Capitanio, C.; Wilfling, F.; Plitzko, J. &amp;amp;amp; Erdmann, P. S. Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography. Journal of visualized experiments: JoVE, 2021&lt;br /&gt;
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== Abstract ==&lt;br /&gt;
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Cryo-electron tomography (cryo-ET) has become the method of choice for investigating cellular ultrastructure and molecular complexes in their native, frozen-hydrated state. However, cryo-ET requires that samples are thin enough to not scatter or block the incident electron beam. For thick cellular samples, this can be achieved by cryo-focused ion beam (FIB) milling. This protocol describes how to target specific cellular sites during FIB milling using a 3D-correlative approach, which combines three-dimensional fluorescence microscopy data with information from the FIB-scanning electron microscope. Using this technique, rare cellular events and structures can be targeted with high accuracy and visualized at molecular resolution using cryo-transmission electron microscopy (cryo-TEM). &lt;br /&gt;
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== Keywords ==&lt;br /&gt;
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== Links ==&lt;br /&gt;
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https://www.jove.com/es/t/62886/sample-preparation-3d-correlative-focused-ion-beam-milling-for-high&lt;br /&gt;
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== Related software ==&lt;br /&gt;
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== Related methods ==&lt;br /&gt;
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== Comments ==&lt;/div&gt;</summary>
		<author><name>WikiSysop</name></author>
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