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	<title>2023Schreiber charge - Revision history</title>
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	<updated>2026-06-13T13:25:35Z</updated>
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	<entry>
		<id>https://3demmethods.i2pc.es/index.php?title=2023Schreiber_charge&amp;diff=4386&amp;oldid=prev</id>
		<title>WikiSysop: Created page with &quot;== Citation ==  Schreiber, Makoto Tokoro / Maigné, Alan / Beleggia, Marco / Shibata, Satoshi / Wolf, Matthias. Temporal dynamics of charge buildup in cryo-electron microscopy...&quot;</title>
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		<updated>2023-07-25T09:58:31Z</updated>

		<summary type="html">&lt;p&gt;Created page with &amp;quot;== Citation ==  Schreiber, Makoto Tokoro / Maigné, Alan / Beleggia, Marco / Shibata, Satoshi / Wolf, Matthias. Temporal dynamics of charge buildup in cryo-electron microscopy...&amp;quot;&lt;/p&gt;
&lt;p&gt;&lt;b&gt;New page&lt;/b&gt;&lt;/p&gt;&lt;div&gt;== Citation ==&lt;br /&gt;
&lt;br /&gt;
Schreiber, Makoto Tokoro / Maigné, Alan / Beleggia, Marco / Shibata, Satoshi / Wolf, Matthias. Temporal dynamics of charge buildup in cryo-electron microscopy. 2023. J. Structural Biology: X, Vol. 7, p. 100081 &lt;br /&gt;
&lt;br /&gt;
== Abstract ==&lt;br /&gt;
&lt;br /&gt;
It is well known that insulating samples can accumulate electric charges from exposure to an electron beam. How&lt;br /&gt;
the accumulation of charge affects imaging parameters and sample stability in transmission electron microscopy&lt;br /&gt;
is poorly understood. To quantify these effects, it is important to know how the charge is distributed within the&lt;br /&gt;
sample and how it builds up over time. In the present study, we determine the spatial distribution and temporal&lt;br /&gt;
dynamics of charge accumulation on vitreous ice samples with embedded proteins through a combination of&lt;br /&gt;
modeling and Fresnel diffraction experiments. Our data reveal a rapid evolution of the charge state on ice upon&lt;br /&gt;
initial exposure to the electron beam accompanied by charge gradients at the interfaces between ice and carbon&lt;br /&gt;
films. We demonstrate that ice film movement and charge state variations occur upon electron beam exposure&lt;br /&gt;
and are dose-rate dependent. Both affect the image defocus through a combination of sample height changes and&lt;br /&gt;
lensing effects. Our results may be used as a guide to improve sample preparation, data collection, and data&lt;br /&gt;
processing for imaging of dose-sensitive samples.&lt;br /&gt;
&lt;br /&gt;
&lt;br /&gt;
== Keywords ==&lt;br /&gt;
&lt;br /&gt;
== Links ==&lt;br /&gt;
&lt;br /&gt;
https://www.sciencedirect.com/science/article/pii/S2590152422000228&lt;br /&gt;
&lt;br /&gt;
== Related software ==&lt;br /&gt;
&lt;br /&gt;
== Related methods ==&lt;br /&gt;
&lt;br /&gt;
== Comments ==&lt;/div&gt;</summary>
		<author><name>WikiSysop</name></author>
	</entry>
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