Difference between revisions of "2013Egerton RadiationDamage"
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Latest revision as of 09:33, 1 April 2013
Citation
Egerton, R. F. Control of radiation damage in the TEM. Ultramicroscopy, 2013, 127, 100-108
Abstract
The problem of electron-beam damage in the transmission electron microscope is reviewed, with an emphasis on radiolysis processes in soft materials and organic specimens. Factors that determine the dose-limited resolution are identified for three different operational modes: bright-field scattering-contrast, phase-contrast and dark-field microscopy. Methods of reducing radiation damage are discussed, including low-dose techniques, cooling or encapsulating the specimen, and the choice of imaging mode, incident-beam diameter and incident-electron energy. Further experiments are suggested as a means of obtaining a better understanding and control of electron-beam damage.
Keywords
Radiation damage, resolution limit, low dose imaging, cryoEM
Links
http://www.ncbi.nlm.nih.gov/pubmed/22910614
