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• 17:28, 17 January 2025 WikiSysop talk contribs created page 2025Elferich CTFFind5 (Created page with "== Citation == J. Elferich, L. Kong, X. Zottig, and N. Grigorieff, “CTFFIND5 provides improved insight into quality, tilt, and thickness of TEM samples,” eLife, vol. 13, p. RP97227, 2024. == Abstract == Images taken by transmission electron microscopes are usually affected by lens aberrations and image defocus, among other factors. These distortions can be modeled in reciprocal space using the contrast transfer function (CTF). Accurate estimation and correction of...")